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HPR-30 Series

HPR-30 Series

 

Residual gas analysis systems for vacuum process analysis

 

The HPR-30 Series are residual gas analysis systems configured for analysis of gases and vapors in vacuum processes and for vacuum diagnostics with sampling capability from high vacuum to atmospheric pressure. The systems are fully configurable for individual process applications such as CVD, ALD, plasma etching, MOCVD, process gas purity and in-process contaminant monitoring.

 

🛑 Overview

The HPR-30 Series systems are designed for fast response high sensitivity analysis of gas and vapor species in vacuum processes. Applications include leak detection, contamination monitoring, process trend analysis and analysis of high mass species and precursors used in ALD and MOCVD applications for example.

Sampling configurations are offered as:

• HPR-30 cart with dual conductance sampling inlet features a close-coupled re-entrant aperture for sampling directly within the process region, providing maximum data integrity and fast confirmation of process status.

• HPR-30 Multi inlet cart with multiple flexible inlets, 1m long and tri-valve manifold connection with automated switching for analysis over a wide process pressure range.

• HPR-30 SGL with a single heated sampling line for applications where there is limited tool space for sampling connection, and where the requirement for analysis of less volatile reaction products requires a fully heated inlet solution. Time resolved data acquisition suited to pulsed deposition process monitoring is offered as a system option.

Options include the innovative Hiden 3F series triple filter quadrupole system providing enhanced abundance sensitivity, part-per-billion (ppb) detection levels and high contamination resistance, particularly suited to the analysis of aggressive gases in CVD and RIE applications.

 

🛑 Features

• Versatile configurable vacuum process sampling systems

• Mass range options 200, 300, 500 or 1000 amu

• Leak detection

• Process trend analysis

• Contamination monitoring

 

🛑 Applications

• Plasma characterization

• Freeze drying

• CVD / MOCVD / ALD

• Vacuum processing

• Residual gas analysis

• Near atmospheric XPS, APXPS 

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