Surface Analysis

Surface Analysis

Specializing in high-precision surface analysis solutions, Hiden Analytical offers class-leading mass spectrometers and turn-key systems for advanced surface science applications. Here you will find a comprehensive list of our mass spectrometry products for layer structure identification, surface contamination studies, and more.

☑️ Compact SIMS

The Hiden Compact SIMS (secondary ion mass spectrometry) has a low form factor and simple, user-friendly layout, with outstanding isotopic sensitivity across the entire periodic table.

☑️ AutoSIMS

A robust surface analysis solution for high throughput operations, the AutoSIMS can perform hundreds of processes a day without operator intervention.

☑️ SIMS / SNMS Workstation

The SIMS Workstation combines dynamic and static SIMS analysis with a dual-mode mass spectrometer for positive (+ ve) and negative (-ve) ion detection, and an additional secondary neutral mass spectrometry (SNMS) detection mode, for superior flexibility in surface analysis applications.

☑️ ToF-qSIMS Workstation

The Hiden TOF-qSIMS system is designed for surface analysis and depth profiling applications of a wide range of materials including polymers, pharmaceuticals, superconductors, semiconductors, alloys, optical and functional coatings and dielectrics, with measurement of trace components to sub-ppm levels.

☑️ EQS SIMS Analyzer

With high transmission rates and an integrated 45 ° electrostatic sector energy analyzer, the Hiden EQS (electrostatic quadrupole) is a versatile positive and negative ion SIMS detector for surface analysis applications at the nanoscale.

☑️ MAXIM

The Hiden MAXIM is a complete quadrupole mass spectrometry system with high transmission optics and a triple mass filter, supporting detailed surface composition mapping at a mass range of up to 1000 atomic mass units (AMU).

☑️ IG5C

The IG5C features a low power, high brightness, surface ionization source coupled to a compact ion column, providing high performance in a small package. The IG5C is designed as a primary ion beam for all SIMS applications, dynamic, static and imaging.

☑️ IG20

Designed primarily for oxygen compatibility, the Hiden IG20 is a high-performance electron impact ion source with a high current density for an intense spot of just 100 micrometres (µm) in diameter.

☑️ Modular SIMS

Add high performance SIMS capability to your surface analysis chamber.

☑️ Custom SIMS Solutions

The modular nature of Hiden products allows us to efficiently custom design instruments for specific applications and locations.

☑️ XPS for SIMS